Bakhtiar, Amirul Faidhi, Adzhar Rambli, Ibrahim Mohamed, Zulaikha Amran, Nazim Aimran, and Raiha Shazween Redzuan. 2026. “Comparing RCDU and Ga Statistics for Patch Of Outliers Detection in Von Mises (VM) Samples ”. Journal of Quality Measurement and Analysis 22 (SI):311-21. https://doi.org/10.17576/jqma.22si.2026.17.